Emberion's nanotechnology-based VIS-SWIR detectors provide superior responsivity with very low noise over a broad spectral range (400 - 1800 nm wavelength extending up to 2,000nm) on a single detector chip.

Emberion's nanotechnology-based VIS-SWIR detectors provide superior responsivity with very low noise over a broad spectral range (400 - 1800 nm wavelength extending up to 2,000nm) on a single detector chip (Picture source: Emberion)

The dynamic range is very large resulting in non-saturating performance. Emberion has developed sensor device structures, materials, and manufacturing methods for their fabrication directly on standard CMOS wafers. This allows monolithic integration of sensor arrays and readout integrated circuitry (ROIC). The in-house designed ROIC ensures the optimal operation of the photodetectors and performs with optimised signal processing.

Emberion’s products demonstrate the potential and maturity of Emberion's novel nanotechnologies aimed for various applications, including industrial machine vision, defense and security night vision, where Emberion will enable new application areas of SWIR imaging through attractive value propositions.